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SEMTech Solutions
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SEMTech Solutions
Used SEM sales, accessories & service -
Analytical Testing Services
FE-SEM / EDS analysis -
STS-Elionix
Electron Beam Lithography Systems
Zeiss NEON 40 EsB CrossBeam
Price available upon request
The NEON 40 EsB combines the imaging and analytical capabilities of a high resolution FE-SEM, using the proven GEMINI lens design, with an advanced Canion FIB column. In addition, this CrossBeam system has a multi-channel gas injection system (GIS) for deposition of metal and insulating layers, and can also perform enhanced and selective etching. The EsB (integrated energy and angle selective BSE) detector of the NEON 40 provides advanced compositional information and ultra-high BSE imaging at very short working distances. Other features include a 6-axes fully eucentric motorized stage, IR CCD camera for sample viewing, 100mm airlock, and integrated CrossBeam/SmartSEM GUI based on Windows XP. Included with this CrossBeam system is a 6 month warranty and on-site installation.
| Type | Resolution | Sample | Options | |
| TFE / FIB | 2.5nm @ 1kV | 330mm dia. chamber, 102mm X,Y | Canion FIB, 5 Channel GIS, 100mm Airlock | |
| CONTACT US FOR MORE INFO | ||||