JEOL JSM-6340F SEM

JEOL JSM-6340F SEM

Price available upon request

The JEOL JSM-6340F features an in-lens secondary electron detector capable of offering a resolution of 2.5 nm at 1kV. Also included is our X-Stream Imaging System, with WinXP for image capture and networking capability.

Type Resolution Sample Options
CFE 2.5 nm @ 1 kV 1.2 nm @ 20 kV 4” max., 50 mm X 70 mm Y X-SIS, 4” Airlock, Cold Trap
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