-
SEMTech Solutions
-
SEMTech Solutions
Used SEM sales, accessories & service -
Analytical Testing Services
Outsourced FE-SEM / EDS analysis -
STS-Elionix
Electron Beam Lithography Systems
SEMs Currently Available for Demonstration
Zeiss SUPRA 55VP SEM
Price available upon request
The SUPRA® is an ultra high resolution FE-SEM based on the unique GEMINI® Technology. The large specimen chamber allows integration of optional detectors and accessories. The unique variable pressure (VP) capability of SUPRA® enables examination of non-conducting specimens without time consuming preparation.
| Type | Resolution | Sample | Options | |
| TFE | 1.7nm @ 1kV, 2nm @ 30kV (VP) | 330mm dia. chamber; X,Y = 130mm; Z = 50mm | EDAX SDD EDS, TSL EBSD, Robinson BSE, STEM, Haskris Chiller, UPS, Deben Hot/Cold Stage. | |
| CONTACT US FOR MORE INFO | ||||
Email this page
Zeiss NEON 40 EsB CrossBeam
Price available upon request
The NEON 40 EsB combines the imaging and analytical capabilities of a high resolution FE-SEM, using the proven GEMINI lens design, with an advanced Canion FIB column. In addition, this CrossBeam system has a multi-channel gas injection system (GIS) for deposition of metal and insulating layers, and can also perform enhanced and selective etching. The EsB (integrated energy and angle selective BSE) detector of the NEON 40 provides advanced compositional information and ultra-high BSE imaging at very short working distances. Other features include a 6-axes fully eucentric motorized stage, IR CCD camera for sample viewing, 100mm airlock, and integrated CrossBeam/SmartSEM GUI based on Windows XP. Included with this CrossBeam system is a 6 month warranty and on-site installation.
| Type | Resolution | Sample | Options | |
| TFE / FIB | 2.5nm @ 1kV | 330mm dia. chamber, 102mm X,Y | Canion FIB, 5 Channel GIS, 100mm Airlock | |
| CONTACT US FOR MORE INFO | ||||
AMRAY 1845 Field Emission SEM
Price available on request
The AMRAY 1845 features a 3 axes stage motorization package (X, Y, and R) and an IR Chamberview System. This system has been upgraded to WinXP for digital image capture and networking.
| Type | Resolution | Sample | Options | |
| TFE | 4nm@1kV | 8" max 152mm, X, Y | EDS, BSE | |
| CONTACT US FOR MORE INFO | ||||
ELIONIX 8900 Field Emission SEM
Price available on request
The ELIONIX 8900FE SEM is a unique system offering calibrated measurements in X, Y, and Z! This capability is made possible by 4 secondary electron detectors geometrically positioned around the primary beam and sample. More details on this 3D SEM can be found at www.sts-elionix.com.
| Type | Resolution | Sample | Options | |
| TFE | 5 nm @ 1kV, 1.2 nm @ 30kV | 6" Max., 50 mm X, 88 mm Y | ||
| CONTACT US FOR MORE INFO | ||||
AMRAY 3300 Field Emission SEM
Price available upon request
The AMRAY 3300 FE-SEM offers high resolution, high magnification imaging. This SEM has a large chamber and a 3 axes (X,Y, and R) motorized stage and has been upgraded to WinXP for digital image capture and networking.
| Type | Resolution | Sample | Options | |
| TFE | 5 nm @ 1.5 kV, 1.5 nm @ 20 kV | 8” max., 100 mm X/Y | EDS, 3 axes motorized stage, WinXP upgrade | |
| CONTACT US FOR MORE INFO | ||||
Hitachi S-4200 Field Emission SEM
Price available on request
This Hitachi S-4200 FE-SEM is in excellent condition. The imaging capability is super, and the system has been refurbished with our X-Stream Imaging System, which allows for image capture and networking via a Windows XP platform.
| Type | Resolution | Sample | Options | |
| CFE | 5 nm @ 1 kV 1.6 nm @ 15 kV | 4” max., 100 mm X, 50 mm Y | EDS, BSE, IR Camera, Cold Finger, X-SIS | |
| CONTACT US FOR MORE INFO | ||||
AMRAY 1910 Field Emission SEM
Price available upon request
The AMRAY 1910 FE features a 3 axes stage motorization package (X, Y, and R), along with a 4” load lock for fast transfer of samples. Also, this system has been upgraded to WinXP for digital image capture and networking.
| Type | Resolution | Sample | Options | |
| TFE | 7 nm @ 1 kV 1.5 nm @ 30 kV | 4” max., 100 mm X/Y | 4” Load-lock, 3 axes motorized stage | |
| CONTACT US FOR MORE INFO | ||||
Hitachi S-3200H SEM
Price available on request
The Hitachi Model S-3200H Scanning Electron Microscope is designed for surface observation at high resolution in the fields of medicine, biology, electronics, new materials, and so on. This system comes with an IR Chamber Scope and will be equipped with an STS X-Stream Imaging System.
| Type | Resolution | Sample | Options | |
| W | 3 nm @ 30kV | 5" max., 80 mm X, 40 mm Y | X-SIS, IRCS | |
| CONTACT US FOR MORE INFO | ||||
AMRAY 1830 SEM
Price available upon request
The AMRAY 1830 SEM features a large specimen chamber and many accessory ports for future expansion of analytical capabilities. The system has been upgraded to WinXP for digital image capture and networking.
| Type | Resolution | Sample | Options | |
| W (or LaB6) | 4 nm @ 30 kV | 4” max., 100 mm X/Y | BSE, IRCS, Cold Trap | |
| CONTACT US FOR MORE INFO | ||||
AMRAY 3200 SEM
Price available upon request
The AMRAY 3200 variable pressure SEM allows for uncompromised examination of conventionally unfriendly SEM samples. Standard features include a Robinson BSE, large chamber size, and computer controlled SEM package. Low vacuum specimen chamber pressure to 4 Torr, variable in 25 millitorr steps.
| Type | Resolution | Sample | Options | |
| LV HV W (or LaB6) | 6 nm @ 30 kV 4 nm @ 30 kV | 8” max., 100 mm X/Y | EDS, 3 axes motorized stage, IR Camera WinXP upgrade | |
| CONTACT US FOR MORE INFO | ||||
SEMs Currently being Refurbished
JEOL JSM-6340F SEM
Price available upon request
The JEOL JSM-6340F features an in-lens secondary electron detector capable of offering a resolution of 2.5 nm at 1kV. Also included is our X-Stream Imaging System, with WinXP for image capture and networking capability.
| Type | Resolution | Sample | Options | |
| CFE | 2.5 nm @ 1 kV 1.2 nm @ 20 kV | 4” max., 50 mm X 70 mm Y | X-SIS, 4” Airlock, Cold Trap | |
| CONTACT US FOR MORE INFO | ||||
JEOL JSM-6300F Field Emission SEM
Price available on request
The JEOL6300F SEM uses a field emission gun with cold cathode. The resolution is 1.5 nm in secondary electron imaging (SEI) and 3.0 nm in backscattered electron imaging (BEI) at 30 kV. The airlock specimen chamber allows up to a 32 mm diameter sample, and the size can also be up to 150 mm without the airlock.
| Type | Resolution | Sample | Options | |
| CFE | 1.5 nm @ 30 kV | 5” max., 50 mm X 70 mm Y | X-SIS | |
| CONTACT US FOR MORE INFO | ||||
AMRAY 1860 Field Emission SEM
Price available upon request
The AMRAY 1860 FE SEM features an 8” Auto Loadlock and Windows XP upgrade for digital image capture and networking. This system comes equipped with a 5 axes motorized stage and STS IR Chamber scope.
| Type | Resolution | Sample | Options | |
| TFE | 7 nm @ 1 kV 1.5 nm @ 25 kV | 8” max., 160 mm X 152 mm Y | IRCS, WinXP upgrade, 8” Loadlock | |
| CONTACT US FOR MORE INFO | ||||
JEOL JSM-5900LV SEM
Price available on request
This JEOL JSM-5900 Low Vacuum SEM has been modified by STS to acquire and display the video signal through our X-Stream Imaging System. The SEM comes with an 8" chamber, 5 axis motorized stage, Oxford EDS, and an STS IR ChamberView System.
| Type | Resolution | Sample | Options | |
| W (LV) | 3 nm @ 30kV (SEI), 5 nm @ 30kV (BEI) | 8" max., 125 mm X, 100 mm Y | X-SIS, EDS, IR Camera, 8" Chamber | |
| CONTACT US FOR MORE INFO | ||||
Philips XL 30 SEM
Price available on request
The Philips XL 30 is a conventional SEM with mouse-driven operation in a Windows environment. This system provides both secondary electron and backscattered electron imaging, along with an integrated EDAX system. The XL 30 offers a 4 axis motorized stage with full manual override. This is an excellent tool for both experienced and first-time users.
| Type | Resolution | Sample | Options | |
| W | 3.5nm@30kV | 6" max., 50 mm X & Y | EDX, BSE | |
| CONTACT US FOR MORE INFO | ||||
LEO 435VP SEM
Price available on request
The LEO 435 Variable Pressure SEM offers high-performance with a resolution of 4 nm. Its 5 axis computer controlled stage is mounted in a specimen chamber measuring 300 x 265 x 190 mm.
| Type | Resolution | Sample | Options | |
| W (LV) | 4nm@30kV | 8" max., 100 mm X, 125 mm Y | ||
| CONTACT US FOR MORE INFO | ||||
JEOL JSM-840 SEM
The JEOL JSM-840 is a multi-purpose SEM capable of acceleration voltages up to 40kV. The system has been under a service contract from JEOL USA its entire time. This SEM features an Orion digital image capture system running on Win98, an EDS system making it suitable for elemental analysis, BSE, and a new NanoMaker Pattern Generator system with beam blanker for electron beam lithography to manufacture nano-scaled patterns.
| Type | Resolution | Sample | Options | |
| W | 4nm | 4” max., 15mm X, 25mm Y, 31mm Z | EDS, BSE, Beam Blanker, NM PG, Orion digital imaging | |
| CONTACT US FOR MORE INFO | ||||