AMRAY 3300 FE-SEM Win10 SEM UI

Bringing New Life, Service and Accessories to Used SEMs

Experience the feeling of a brand new SEM at a fraction of the price with our SEMView8000 Win10 technology.

Trusted by

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Fortune 500s
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Universities

When compared to used SEMs, SEMView8000 upgraded systems deliver:

Better productivity with a new Win10 SEM user interface and new electronics, creating superior image clarity

Enhanced security through advanced firewall and anti-virus software giving you protection and the ability to collaborate remotely with out of network groups

World class support with a dedicated team of electron beam professionals located throughout the Americas and Europe, flexible contracts, and remote diagnostic capabilities

Refurbished SEM Package - Powered by SEMView8000:

Don’t have a SEM column to upgrade? Purchase a factory certified SEM driven by the SEMView8000. We will configure your system with various SEM accessories and provide installation, training, and after-sales support.

Over 200 Years of Combined Experience To Service Your SEMs

We offer service contracts to support optimal system performance and minimize the downtime of your equipment.
Hitachi S 4700 SEM

Schedule an Interactive Demonstration
with Our Application Engineer

Test out your specific use case by choosing from one of our many in-house samples – or send your own to us. See exactly what the SEMView8000 has to offer.

Latest News

Your scanning electron microscope (SEM), typically combined with an Energy Dispersive (EDS) system, is a vital piece of laboratory equipment. In order to keep it working its best, and get the highest possible quality images, you need a strong partner…

You need your scanning electron microscope (SEM) to optimally perform to give you the best  possible images for your application. But what can you do when your technology isn’t meeting the expected standard? You might think a new SEM is…

Your scanning electron microscope (SEM) is designed to create high-quality imaging to get you the most accurate information possible about your sample. A backscattered electron (BSE) detector is an important part of that process, giving you enhanced data about the…

Your scanning electron microscope is an important instrument that enables your work. You need your SEM to perform its best and provide superior quality images. So how can you be sure you’re getting the best possible images from your SEM?…

A SEMView8000 integrated with an AMRAY 1845 Field Emission (FE) SEM has shipped from our San Jose, California manufacturing facility.  The destination is a college in the state of Iowa.  This system follows several recent JEOL SEMView8000 integration shipments from…

In a recent scientific paper published by Nature.com (PDF), coauthored by Steven DiGregorio working in the Hildreth Research Group at the Colorado School of Mines, the SEMView8000 attached to an AMRAY 3300 field emission (FE) SEM was used to characterize…

Your Scanning Electron Microscope (SEM) is a core part of your work — which is why it must function properly at all times. For that reason, it’s important to routinely check your SEM and have it serviced when needed. What…

Is your Scanning Electron Microscope (SEM) still able to produce high-quality results? A SEM, in conjunction with your EDS system, is a significant investment, so considering what to do when your tool isn’t cutting it can be daunting. If your…

Upgrading your SEM is easier than you think. Whether you are looking to achieve results beyond the capabilities of your SEM’s current electronics, or to increase the overall reliability with a dedicated service support infrastructure, there are options to replacing…

The SEMView8000 Scanning Electron Microscope (SEM) universal operator’s console has been installed at a R&D/QC manufacturing laboratory.  Assembled and tested in our Michigan facility, the SEMView8000 has been integrated to a JEOL JSM-5600LV low vacuum SEM column.  The SEMView8000 replaces…

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