News & Events

SEMTech Solutions Now Offers Silicon Drift Detectors (SDD) for EDS Analysis

In our continuing drive to bring value to our customers, our engineering department has created a new Windows 7TM SEM User Interface for our refurbished SEMs. This new software will allow most SEM operations to be run via a mouse. No need for… Read More

EBL Sample Holder for SEMs

SEMTech Solutions has recently introduced an Electron Beam Lithography (EBL) sample holder for scanning electron microscopes (SEMs). The major benefit of this holder is that the Faraday cup and resolution standard (Au/C or Sn/C) is in the same focal… Read More

See Us at M&M 2019 in Oregon

SEMTech Solutions will be attending the Microscopy and Microanalysis Meeting in Portland, Oregon from August 5-9. On display will be our SEMView8000 Universal Operator Console attached to a FEI XL30 column, as well as our IR Chamberscope, and other… Read More

Scanning Electron Microscopy (SEM) Analytical Laboratory

“Calling all Microscopists!” SEMTech Solutions new Microscopy Services Website is fast becoming a reference library for materials analysis.

SEMTech Solutions Analytical Testing Laboratory has launched a new website designed to showcase its capabilities through a gallery of their microscopy work. The site can be found at www.atl.semtechsolutions.com.

See Us at Microscopy and Microanalysis in Baltimore

See Us at M&M 2018 in Baltimore

SEMTech Solutions has redesigned the IR Chamberscope with these new features: Double the Resolution (now 800 TV lines) The option to save images (JPG, PNG, TIFF) and videos (AVI) The option for standard or wide angle lenses For more information,… Read More