Hitachi S-47000 with SEMView8000 Image
Hitachi S-47000 with SEMView8000 Image

Win11 Hitachi S-4700 Refurbished FE SEM

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Price available by request

The Hitachi S-4700 SEM is a cold field scanning electron microscope (FE-SEM), capable of high resolution imaging in the nanometer range.  Under optimal environmental conditions, this system can magnify images upwards of 200,000 times or more and resolve features down to 2 nanometers.  Additional features of this Hitachi SEM include:

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Accelerating Voltage: 0.5 – 30 kV

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Resolution (SE): 2.5 nm @ 1 kV; 1.5 nm @ 15 kV

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Specimen size: Up to 100mm in diameter and up to 17mm high

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