hitachi-s3200-w-
hitachi-s3200-w-

Win10 Hitachi S3200N Refurbished SEM

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Price available by request

For conductive samples, the S3200N is typically operated in high vacuum mode and images are collected with the secondary electron detector. For insulating samples, the instrument is typically operated in variable pressure mode and images are collected with the Robinson backscattered electron detector. Standard features of this system include:

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Accelerating Voltage: 0.3 – 30 kV

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Resolution (SE): 3.5 nm @ 30kV

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Specimen size: Up to 150mm in diameter and up to 40mm thick

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