Win10 Hitachi S3200N Refurbished SEM
Price available by request
For conductive samples, the S3200N is typically operated in high vacuum mode and images are collected with the secondary electron detector. For insulating samples, the instrument is typically operated in variable pressure mode and images are collected with the Robinson backscattered electron detector. Standard features of this system include:
Accelerating Voltage: 0.3 – 30 kV
Resolution (SE): 3.5 nm @ 30kV
Specimen size: Up to 150mm in diameter and up to 40mm thick
- Win10 dedicated SEM user interface
- 8k x 8k SEM digital imaging
- Remote access and operation capabilities, along with advanced security features
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