Win10 JEOL JSM-5900LV Refurbished SEM
Price available by request
The low-vacuum capability of the JEOL 5900LV means non-conductive samples don’t require a coating for observation, and its optional energy-dispersive X-ray spectroscopy (EDS) detector allows for chemical analysis of samples, with the ability to detect trace elements. Standard features of this system include:
Backscattered Electron Detector
Fully auto 5 axis specimen stage
Special 8" chamber for larger specimens (standard size is 6")
- Win10 dedicated SEM user interface
- 8k x 8k SEM digital imaging
- Remote access and operation capabilities, along with advanced security features
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