jeol-5900lv-w-
jeol-5900lv-w-

Win10 JEOL JSM-5900LV Refurbished SEM

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Price available by request

The low-vacuum capability of the JEOL 5900LV means non-conductive samples don’t require a coating for observation, and its optional energy-dispersive X-ray spectroscopy (EDS) detector allows for chemical analysis of samples, with the ability to detect trace elements. Standard features of this system include:

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Backscattered Electron Detector

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Fully auto 5 axis specimen stage

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Special 8" chamber for larger specimens (standard size is 6")

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