jeol-6400-w-
jeol-6400-w-

Win10 JEOL JSM-6400 Refurbished SEM

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Price available by request

The JEOL 6400 is equipped with a tungsten filament electron source that offers a resolution of 3.5nm at 35kV. Many of these SEMs have been integrated with Nanometer Pattern Generation Systems for electron beam lithography due to their high acceleration voltages. Capabilities of this SEM are:
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Accelerating Voltage 0.2 to 40 KV

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Lens System Electro-magnetic lens

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Specimen Stage X=50 mm, Y=70 mm, Z=48mm, T -5 to +90 degrees, R 360

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