Win10 JEOL JSM-5600LV Refurbished SEM
Price available by request
The JEOL JSM-5600LV can operate in high- or low-vacuum modes, allowing sub-micron-scale imaging without needing to coat or modify your sample. An optional EDS detector can be used to create a qualitative and semi-quantitative elemental analysis of sub-micron point volumes, X-ray mapping over mm-scale single fields of view, and X-ray line scans.
Resolution: 5.0 nm @ 30kV
Accelerating Voltage: 0.5 to 30 kV
Sample Size: Up to 125 mm in diameter
Upgrades
Upgrades
This SEM has been upgraded with the SEMTech Solutions SEMView8000 universal operators control console. This electronics package includes new power supplies and universal SEM & vacuum control cards. The main features of this package are:
- Win10 dedicated SEM user interface
- 8k x 8k SEM digital imaging
- Remote access and operation capabilities, along with advanced security features
Can’t find what you’re looking for? Not a problem.
At SEMTech Solutions, our experts are ready to help you find the right technology for the job. If you can’t find the system you need, contact us. One of our experts would be happy to help you find the right used SEM.
