Win10 JEOL JSM-6490LV Refurbished SEM
Price available by request
The W-filament JEOL 6490LV SEM can operate in high- or low-vacuum modes, allowing sub-micron-scale imaging and X-ray compositional data collection without needing to coat or modify your sample. An optional EDS detector can be used to create a qualitative and semi-quantitative elemental analysis of sub-micron point volumes, X-ray mapping over mm-scale single fields of view, and X-ray line scans.
Resolution: 3.0 nm @ 30kV, High Vacuum
Accelerating Voltage: 0.3 to 30 kV
X=125mm, Y=100mm, Z=5 to 80mm; 12" wafer can be loaded.
- Win10 dedicated SEM user interface
- 8k x 8k SEM digital imaging
- Remote access and operation capabilities, along with advanced security features
Resolution:
High Vacuum mode: 3.0 nm(30kV)
Low Vacuum mode: 4.0 nm(30kV)
Accelerating Voltage: 0.3 to 30 kV
Magnification: x5 to 300,000
Filament: Pre-centered W hairpin filament
Objective Lens: Super Conical lens
Maximum Specimen Size: 8″ coverage, 12″ specimen can be loaded
Specimen Stage:
5 axis computer controlled Eucentric goniometer
X=125mm, Y=100mm, Z=5 to 80mm
T= -10 to 90°, R=360° (endless)
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