fei-xl30-w-
fei-xl30-w-

Win11 FEI XL30 Refurbished SEM

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Price available by request

The FEI XL30 environmental SEM is capable of imaging non-conductive samples without the need for coating. Compositional information may be obtained using a backscattered electron detector, while elemental analysis can be performed with an optional energy dispersive X-ray spectroscopy (EDS) detector.

The FEI XL30 includes:

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Electron column with Tungsten Emitter, 1 to 30kV

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SEMTech Solutions F1-BSE detector

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Four-axis motorized Eucentric stage with XYZ: 50 x 50 x 20 mm and manual tilt

Frequently Asked Questions

What is the Win11 FEI (Philips) XL30 Refurbished ESEM?

A refurbished FEI XL30 environmental scanning electron microscope upgraded with SEMTech Solutions’ SEMView8000 universal operator control console.

What electronics upgrade does SEMView8000 provide on this XL30?

The SEMView8000 package replaces legacy electronics and adds new power supplies plus universal SEM and vacuum control cards.

What electron source and kV range are listed?

An electron column with a tungsten emitter and an accelerating voltage range of 1 to 30 kV.

What stage is included with this system?

A four-axis motorized eucentric stage with XYZ travel of 50 x 50 x 20 mm and manual tilt.

What detector is specified on the product page?

An F1-BSE backscattered electron detector from SEMTech Solutions.

What control software does it use?

SEMView8000 provides a Windows 11 SEM user interface with support for high-resolution (up to 8k x 8k) digital imaging.

Is a warranty available?

Yes. SEMTech Solutions indicates a warranty is available for this model.

Can’t find what you’re looking for? Not a problem.

At SEMTech Solutions, our experts are ready to help you find the right technology for the job. If you can’t find the system you need, contact us. One of our experts would be happy to help you find the right used SEM.