jeol-6390lv-w-
jeol-6390lv-w-

Win11 JEOL JSM 6390LV Refurbished SEM

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Price available by request

The JEOL JSM-6390LV is used in many and varied applications with optional upgrades that increase its versatility. The low vacuum mode allows the observation of non-conducting, uncoated samples.

Standard features of JEOL JSM 6390LV system include:

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Accelerating Voltage: 0.5 to 30kV

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Filament: Tungsten

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Imaging modes: Secondary electron (SE), Backscattered electron (BSE)

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Specimen size: 150mm x 45mm

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