Win11 Refurbished JEOL JSM 6400 SEM
Price available by request
The JEOL 6400 SEM is equipped with a tungsten filament electron source that offers a resolution of 3.5nm at 35kV. Many of these SEMs have been integrated with Nanometer Pattern Generation Systems for electron beam lithography due to their high acceleration voltages. Capabilities of JEOL 6400 SEM are:
Accelerating Voltage 0.2 to 40 KV
Lens System Electro-magnetic lens
Specimen Stage X=50 mm, Y=70 mm, Z=48mm, T -5 to +90 degrees, R 360
JEOL 6400 SEM has been upgraded with the SEMTech Solutions SEMView8000 universal operators control console. This electronics package includes new power supplies and universal SEM & vacuum control cards. The main features of this package are:
- Win11 dedicated SEM user interface
- 8k x 8k SEM digital imaging
- Remote access and operation capabilities, along with advanced security features
Frequently Asked Questions
What is the Win11 JEOL 6400 Refurbished SEM?
A refurbished JEOL 6400 analytical scanning electron microscope offered by SEMTech Solutions for routine materials characterization, research, and quality control at micron scale.
Who is this system a good fit for?
Labs and facilities needing a dependable analytical SEM for everyday imaging and analysis tasks in materials research and QC workflows.
What software and operating system control the microscope?
SEMTech Solutions integrates its SEMView8000 control console on Windows 11, providing a modern SEM interface and high-resolution digital imaging.
Is a warranty available with this refurbished system?
Yes. SEMTech Solutions indicates that a warranty is available for this model; inquire for specific coverage details.
Can’t find what you’re looking for? Not a problem.
At SEMTech Solutions, our experts are ready to help you find the right technology for the job. If you can’t find the system you need, contact us. One of our experts would be happy to help you find the right used SEM.