jeol-6400-w-
jeol-6400-w-

Win11 Refurbished JEOL JSM 6400 SEM

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Price available by request

The JEOL 6400 SEM is equipped with a tungsten filament electron source that offers a resolution of 3.5nm at 35kV. Many of these SEMs have been integrated with Nanometer Pattern Generation Systems for electron beam lithography due to their high acceleration voltages. Capabilities of JEOL 6400 SEM are:

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Accelerating Voltage 0.2 to 40 KV

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Lens System Electro-magnetic lens

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Specimen Stage X=50 mm, Y=70 mm, Z=48mm, T -5 to +90 degrees, R 360

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