JEOL JSM-5600LV with SEMView8000 Image
JEOL JSM-5600LV with SEMView8000 Image

Win11 JEOL JSM 5600 LV Refurbished SEM

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Price available by request

The JEOL JSM 5600 LV  can operate in high- or low-vacuum modes, allowing sub-micron-scale imaging without needing to coat or modify your sample. An optional EDS detector can be used to create a qualitative and semi-quantitative elemental analysis of sub-micron point volumes, X-ray mapping over mm-scale single fields of view, and X-ray line scans.  JEOL JSM 5600 LV features include:

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Resolution: 5.0 nm @ 30kV

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Accelerating Voltage: 0.5 to 30 kV  

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Sample Size: Up to 125 mm in diameter

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