JEOL JSM-6480LV SEM Image with SEMView8000
JEOL JSM-6480LV SEM Image with SEMView8000

Win11 JEOL JSM-6480LV Refurbished SEM

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Price available by request

The JSM-6480LV JEOL scanning electron microscope is a high-performance SEM is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode allows for observation of specimens which cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface. Its five-axis eucentric stage with compucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter.  Other features of this JEOL scanning electron microscope include:

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Compact Footprint

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Super conical lens

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Smart settings for common samples

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