Win11 JEOL JSM-6490LV Refurbished SEM
Price available by request
The W-filament JEOL 6490LV SEM can operate in high- or low-vacuum modes, allowing sub-micron-scale imaging and X-ray compositional data collection without needing to coat or modify your sample, at a competitive JEOL SEM price. An optional EDS detector can be used to create a qualitative and semi-quantitative elemental analysis of sub-micron point volumes, X-ray mapping over mm-scale single fields of view, and X-ray line scans. For specifics about the price of this JEOL SEM, please request a quote.
Resolution: 3.0 nm @ 30kV, High Vacuum
Accelerating Voltage: 0.3 to 30 kV
X=125mm, Y=100mm, Z=5 to 80mm; 12" wafer can be loaded.
JEOL JSM-6490LV has been upgraded with the SEMTech Solutions SEMView8000 universal operators control console. This electronics package includes new power supplies and universal SEM & vacuum control cards. The main features of this package are:
- Win11 dedicated SEM user interface
- 8k x 8k SEM digital imaging
- Remote access and operation capabilities, along with advanced security features
Resolution:
High Vacuum mode: 3.0 nm(30kV)
Low Vacuum mode: 4.0 nm(30kV)
Accelerating Voltage: 0.3 to 30 kV
Magnification: x5 to 300,000
Filament: Pre-centered W hairpin filament
Objective Lens: Super Conical lens
Maximum Specimen Size: 8″ coverage, 12″ specimen can be loaded
Specimen Stage:
5 axis computer controlled Eucentric goniometer
X=125mm, Y=100mm, Z=5 to 80mm
T= -10 to 90°, R=360° (endless)
Frequently Asked Questions
What is the Win11 JEOL JSM-6490LV Refurbished SEM?
A refurbished JEOL JSM-6490LV scanning electron microscope offered by SEMTech Solutions for sub-micron imaging, with pricing available by request.
Does the 6490LV support low-vacuum imaging for non-conductive samples?
Yes. As an LV model, it provides a low-vacuum mode that allows observation of specimens that cannot be viewed at high vacuum due to moisture or non-conductive surfaces.
What resolution is commonly stated for the JSM-6490LV?
JEOL literature commonly cites about 3.0 nm resolution (in high vacuum).
What detectors are typical for 6490LV configurations?
Typical systems include secondary electron (SE) and backscattered electron (BSE) detectors, with optional EDS for elemental analysis depending on configuration.
What software and OS control SEMTech Solutions' Win11 units?
SEMTech integrates its SEMView8000 console on Windows 11, providing a dedicated SEM UI with up to 8k x 8k digital imaging and secure remote access.
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At SEMTech Solutions, our experts are ready to help you find the right technology for the job. If you can’t find the system you need, contact us. One of our experts would be happy to help you find the right used SEM.