JEOL JSM-6490LV SEM with SEMView8000
JEOL JSM-6490LV SEM with SEMView8000

Win11 JEOL JSM-6490LV Refurbished SEM

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Price available by request

The W-filament JEOL 6490LV SEM can operate in high- or low-vacuum modes, allowing sub-micron-scale imaging and X-ray compositional data collection without needing to coat or modify your sample, at a competitive JEOL SEM price. An optional EDS detector can be used to create a qualitative and semi-quantitative elemental analysis of sub-micron point volumes, X-ray mapping over mm-scale single fields of view, and X-ray line scans. For specifics about the price of this JEOL SEM, please request a quote. 

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Resolution: 3.0 nm @ 30kV, High Vacuum

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Accelerating Voltage:  0.3 to 30 kV  

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X=125mm, Y=100mm, Z=5 to 80mm; 12" wafer can be loaded.

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