Win11 LEO 1450VP Refurbished SEM
Price available by request
Whether you are in life sciences, material sciences, industrial quality assurance or failure analysis, the LEO 435 Variable Pressure scanning electron microscope offers high-performance with a resolution of 4 nm. Its 5-axis computer-controlled stage is mounted in a specimen chamber measuring 300 x 265 x 190 mm.
This LEO scanning electron microscope system comes with three detectors:
Robinson Backscattered Electron Detector
Secondary Electron Detector
Four Quadrant Back-Scatter Detector
This LEO scanning electron microscope has been upgraded with the SEMTech Solutions SEMView8000 universal operators control console. This electronics package includes new power supplies and universal SEM & vacuum control cards. The main features of this package are:
- Win11 dedicated SEM user interface
- 8k x 8k SEM digital imaging
- Remote access and operation capabilities, along with advanced security features
Frequently Asked Questions
What is the Win11 LEO 1450VP Refurbished SEM?
A refurbished ZEISS/LEO 1450VP variable-pressure scanning electron microscope upgraded with SEMTech Solutions’ SEMView8000 Windows 11 control console.
What is the advantage of Variable Pressure (VP) on the 1450VP?
VP mode enables imaging of specimens that have not undergone traditional drying and conductive coating preparation, expanding the range of samples you can study.
What electron source does the 1450VP use?
A tungsten filament electron source.
What software and OS control the system?
SEMView8000 on Windows 11, providing a modern SEM UI with up to 8k x 8k digital imaging and secure remote access capabilities.
Is a warranty available?
Yes. SEMTech Solutions indicates a warranty is available for this refurbished model.
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At SEMTech Solutions, our experts are ready to help you find the right technology for the job. If you can’t find the system you need, contact us. One of our experts would be happy to help you find the right used SEM.