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Win11 LEO 1450VP Refurbished SEM

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Price available by request

Whether you are in life sciences, material sciences, industrial quality assurance or failure analysis, the LEO 435 Variable Pressure scanning electron microscope offers high-performance with a resolution of 4 nm. Its 5-axis computer-controlled stage is mounted in a specimen chamber measuring 300 x 265 x 190 mm.

This  LEO scanning electron microscope system comes with three detectors:

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Robinson Backscattered Electron Detector

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Secondary Electron Detector

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Four Quadrant Back-Scatter Detector

Can’t find what you’re looking for? Not a problem.

At SEMTech Solutions, our experts are ready to help you find the right technology for the job. If you can’t find the system you need, contact us. One of our experts would be happy to help you find the right used SEM.