Win11 ZEISS SUPRA 40VP FE-SEM
Price available by request
The Zeiss SUPRA 40VP Field Emission Scanning Electron Microscope is a high performance SEM suitable for both materials and biological applications. It has a wide range of operating beam energies and is capable of variable pressure operation and elemental mapping with high spatial resolution.
Easy-to-use ZEISS SmartSEM software
Thermo Scientific Energy Dispersive X-ray (EDS) detector for elemental mapping
Herzan Active Vibration Isolation System
Specifications
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Specifications
Win11 ZEISS SUPRA 40VP FE-SEM:
- Easy-to-use SmartSEM control software
- Adjustable beam energy from 100 eV to 30 keV
- Short working distance
- Klein 5 Axis MK2 stage
- High probe current (up to 20 nA) with high stability; better than 0.2% / hour
- Multiple detectors:
- Secondary electron (SE) detector for typical SEM imaging
- In-Lens SE detector for topographic imaging
- Backscattered electron detector (BSE) for Z-contrast imaging
- Variable pressure secondary electron detector (VPSE) for imaging in a partially pressurized environment; 1-133 Pa
- Thermo Scientific UltraDry SD Energy Dispersive X-ray (EDS) detector for elemental mapping (sensitive to elements heavier than boron), with 30mm2 Window
- For more information, see the Original ZEISS SUPRA SEM Brochure
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